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Contamination is usually identified by excessive background ions in the mass spectrum. Contamination can originate from GC or MS components in the system. The source of the contamination can sometimes be determined by identifying the contaminant. Some contaminants are much more likely to originate in the GC, some others in the MS.

 

Topics include:

  • Sample
  • Air leaks
  • Oil and cleaning solvents
  • Column bleed
  • Fingerprints
  • Common contaminant ions
  • Maintenance schedules
  • Cleaning contaminated ion sources
GC-MS Contamination